Keithley 2662 OnWafer Reliability free download

File name 2662 OnWafer Reliability.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E system is so well behaved. With two decades of stable Si/SiO2 /polysilicon/Al materials experience, the industry had little need for a large cadre of materials physicists or the infrastructure to train new ones. The indus- try's complacency resulted in the atrophying of the infrastructure needed to train the new materials scientists who are required to over- come the next wave of emerging materials challenges. Today, there is a lack of skilled scientists who can develop new material systems, ex- pand reliability test methodologies, and in- terpret the huge volume of data this entails. Unfortunately, we don't have the luxury of waiting for the redevelopment of a materi- als physicist infrastructure